Rapid Analysis of Volatile Impurities in Pharmaceutical Products Using Direct MS


  • Date
    November 15, 2017
  • Time
    8:00 a.m. PST / 11:00 a.m. EST / 16:00 GMT / 17:00 CET - Duration: 60 Minutes

Date : November 15, 2017
Time : 8:00 a.m. PST / 11:00 a.m. EST / 16:00 GMT / 17:00 CET - Duration: 60 Minutes
  • Overview

    Volatile compounds occur frequently as impurities in pharmaceutical products and are often of concern due their toxicity. SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.
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  • Speakers

    Dr. Vaughan Langford, Ph.D.,
    Director of Applications and Marketing,
    Syft Technologies
    Dr. Mark Perkins, Ph.D.,
    Senior Applications Chemist,
    Anatune Limited
    Mitch Jacoby,
    Senior Correspondent,
    C&EN