SIFT-MS is a revolutionary advance in trace gas and headspace analysis. SIFT-MS analysis is real-time, comprehensive, selective, and economical. Ingenious application of direct, ultra-soft chemical ionization coupled with mass spectrometric detection makes continuous monitoring simple for both routine and chromatographically challenging compounds (e.g. ammonia, formaldehyde, hydrogen chloride, and hydrogen sulfide).

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across an extremely wide range of applications. In this webinar, example applications will include formaldehyde analysis to trace levels in air and headspace, real-time ambient air monitoring for VOCs and odorous compounds, and very high-throughput screening of polymers and packaging.