Materials Characterization Spectroscopy, When Light and Matter Interact: Measuring Absorbance, Reflection, and Scattering In The UV/Vis/NIR Wavelength Region
UV/Vis/NIR Spectroscopy is a commonly used technique for materials characterization of a wide variety of sample types. From solutions, to solid state samples, to nanomaterials, a wealth of information is available, but only if one knows how to properly execute the appropriate measurement.
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This webcast will cover how specific measurement techniques including transmission, specular reflection, diffuse reflection, and angular resolved scattering can be employed to characterize just about any material. Also discussed, will be how to select the proper sample preparation and spectrophotometer measurement configuration (accessory) that will yield meaningful and relevant information to the user.
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