C&EN Whitepaper
Atomic force microscopy covers the landscape of polymer characterization
Brought to you by Bruker
Overview

Atomic Force Microscopy is a powerful technique for analyzing materials at the nanoscale. Through a variety of different modes, AFM can analyze a wide range of chemical, mechanical and even electrical properties across an extensive variety of materials. This whitepaper reviews the many ways that materials scientists can use AFM to examine polymers’ structure and properties at the microscopic level for a more complete understanding of the material.

Key Objectives:
  • Common AFM modes used to characterize polymers and polymer composites
  • Practical considerations for AFM on polymer samples, including tip selection and sample preparation
  • Applications of AFM in characterizing polymers’ mechanical properties
  • Specialized modes for in-depth analysis of viscoelasticity, electrical properties and chemistry

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