Atomic force microscopy covers the landscape of polymer characterization

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Overview

Atomic Force Microscopy is a powerful technique for analyzing materials at the nanoscale. Through a variety of different modes, AFM can analyze a wide range of chemical, mechanical and even electrical properties across an extensive variety of materials. This whitepaper reviews the many ways that materials scientists can use AFM to examine polymersâ€™ structure and properties at the microscopic level for a more complete understanding of the material.

Key Objectivesï¼š

Common AFM modes used to characterize polymers and polymer composites
Practical considerations for AFM on polymer samples, including tip selection and sample preparation
Applications of AFM in characterizing polymersâ€™ mechanical properties
Specialized modes for in-depth analysis of viscoelasticity, electrical properties and chemistry

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