Impurity testing of raw materials used in the production of

lithium-ion batteries using ICP-OES

DATE
Americas and Europe: September 9, 2021
Asia and India: September 10, 2021
TIME
Americas and Europe: 8:00 a.m. PDT, 11:00 a.m. EDT, 4:00 p.m. BST
Asia and India: 10:00 a.m. CST, 11:00 a.m. JST, 11:00 a.m. KST, 7:30 a.m. IST

Duration: 60 Minutes

Overview

Lithium (Li)-ion batteries are widely used in consumer electronic devices due to their large capacity, high voltage, light weight, and lack of memory effects.  The switch to renewable energy sources for many countries and the need for efficient and cost-effective energy storage technologies, has seen increased global demands for lithium-ion batteries and cathode materials. 

Contaminant elements can seriously affect the performance and lifespan of a battery, therefore metal impurities in critical battery-components must be strictly controlled.  Various industry standard methods use ICP-OES to detect macro-elements and trace impurity elements in battery components. Join us to see how modern ICPOES can be used to create robust methods that easily overcome common challenges with this complex matrix type.

Key Learning Objectives
  • Discover how smart ICP-OES streamlines the elemental analysis of the complex matrices found in Li-ion battery samples
  • Learn about impurity testing of raw materials used in the production of lithium-ion batteries using ICP-OES
  • Find out how robust ICP-OES methods can overcome challenges of analyzing samples with high concentrations of lithium accurately and efficiently
  • Learn about a wide range of solutions for ICP-OES analysis for Li-ion battery samples

Who Should Attend
  • Laboratory managers looking for smart streamline solutions for ICP-OES analysis
  • Analysts with challenges analyzing Li-ion battery samples or high complexity samples
  • Battery manufacturer R&D managers
  • Metal manufacturers supplying product to battery producers
  • Mine site lab personnel involved with analysis of minerals needed for battery production

Brought to you by:
Agilent Technologies

Speakers

Dr. Elizabeth Kulikov
ICP-OES Product Manager,
Agilent Technologies
Jeff Huber
Contributing Editor,
C&EN Media Group

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