X-ray diffraction (XRD) is a well-established, non-destructive method to characterize the crystal structure and phase composition of powder or bulk materials. Despite being a standard analytical method, there are still many challenges faced in XRD measurements. For example, detecting weak diffraction peaks arising from minor or impurity phases can be difficult as they are often lost in the measurement background. Alternatively, overlapping peaks, as often seen in multi-component samples, can make correct identification of the present phases difficult.
With the recent introduction of XRDynamic 500, an automated multipurpose powder X-ray diffractometer, and the new instrumentation developments that it has brought, improvements to the data quality and instrument usability have been made that mean that these common challenges can now finally be addressed.
Anton Paar is proud to present “4 Key Developments Advancing Powder XRD,” a live webinar discussing the common challenges faced in XRD measurements and how a new generation of instrumentation seeks to address them. Real-world application examples will be presented on various sample types to showcase the benefits of a modern instrument.
Key Learning Objectives:
- New developments in powder XRD instrumentation that can improve data quality and ease of use
- Real-world applications that showcase the added benefits when using state-of-the-art XRD instrumentation
Who Should Attend:
- Research Scientists
- Laboratory Managers
- University Researchers
- Quality Engineers