Semiconductor Device Fabrication: from 12 to 3 Nanometers – How Will You Get There?


  • Date
    September 17, 2020
  • Time
    8:00 a.m. PDT, 11:00 a.m. EDT, 16:00 BST, 17:00 CEST - Duration: 60 Minutes

Date : September 17, 2020
Time : 8:00 a.m. PDT, 11:00 a.m. EDT, 16:00 BST, 17:00 CEST - Duration: 60 Minutes
  • Overview

    Smaller, faster and more energy-efficient integrated circuitry are the rules of the game in the semiconductor industry, which is constantly evolving and transforming its manufacturing processes to deliver on Moore's law – a journey that constantly calls for the use of ultrapure materials and chemicals, where sub-part per trillion, and eventually sub-part per quadrillion, impurities detection is required.

    How do semiconductor device manufacturers get to smaller nanometer nodes and what analytical instrumentation do they require to achieve faster, smaller, more energy-efficient integrated circuitry?

    During this webcast, you will learn about recent advancements in impurity testing techniques (multi-quadrupole ICP-MS and tri-range IR), empowering semiconductor device manufacturers with the right tools to transition from 12 to 3 nanometers to ensure contaminant-free products.

    Brought to you by:


    PerkinElmer

  • Speakers

    Chady Stephan, PhD
    Chemicals Market Leader,
    PerkinElmer Inc.
    Ian Robertson
    Senior Application Scientist,
    PerkinElmer Inc.
    Melissa O'Meara
    Forensic Science Consultant,
    C&EN Media Group