Smaller, faster and more energy-efficient integrated circuitry are the rules of the game in the semiconductor industry, which is constantly evolving and transforming its manufacturing processes to deliver on Moore's law – a journey that constantly calls for the use of ultrapure materials and chemicals, where sub-part per trillion, and eventually sub-part per quadrillion, impurities detection is required.

How do semiconductor device manufacturers get to smaller nanometer nodes and what analytical instrumentation do they require to achieve faster, smaller, more energy-efficient integrated circuitry?

During this webcast, you will learn about recent advancements in impurity testing techniques (multi-quadrupole ICP-MS and tri-range IR), empowering semiconductor device manufacturers with the right tools to transition from 12 to 3 nanometers to ensure contaminant-free products.