Rapid Volatile Impurity Analysis in Pharmaceutical Products Using SIFT-MS


  • Date
    March 26, 2020
  • Time
    8:00 a.m. PST / 11:00 p.m. EST / 16:00 GMT / 17:00 CET - Duration: 60 Minutes

Date : March 26, 2020
Time : 8:00 a.m. PST / 11:00 p.m. EST / 16:00 GMT / 17:00 CET - Duration: 60 Minutes
  • Overview

    Volatile compounds occur frequently as impurities in pharmaceutical products and are often of concern due their toxicity. SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

    Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:
    • Simple formaldehyde analysis
    • Residual solvent analysis
    • Packaging screening, including residual monomer analysis.

    Join us for this webinar to learn more about how SIFT-MS works and how it speeds and simplifies common volatile analyses for the pharma industry.

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  • Speakers

    Vaughan Langford, PhD
    Principal Scientist,
    Syft Technologies, New Zealand
    Mark Perkins, Ph.D.
    Senior Applications Chemist,
    Anatune Limited
    Jeff Huber
    Contributing Editor,
    C&EN Media Group