Pharmaceutical and food products are susceptible to contamination from packaging – whether from polymeric materials, printing inks, or paperboard. Traditional analytical techniques applied to trace volatiles analysis typically involve significant sample preparation and low throughput. The resulting high cost of analysis means that only limited sample screening is conducted.

This webinar will describe a recent addition to the portfolio of techniques available for routine sample analysis: SIFT-MS. SIFT-MS is a direct mass spectrometry technique that enables rapid, quantitative analysis of volatiles across the full spectrum of packaging materials. The SIFT-MS technique will be introduced, together with its automation, and detailed case studies will describe applications in polymeric and paperboard emissions analysis.