C&EN Whitepaper
Integrated Analysis of High Resolution GC-MS Data Using Hard and Soft Ionization to Identify Trace Impurities
Brought to you by JEOL
Overview

Non-targeted analysis of complex mixtures by GC-HRMS should make use of all of the available data to identify unknowns.  Herein, an automated data analysis software package combining chromatographic deconvolution with integrated analysis of high-resolution mass spectra for electron ionization (EI) and soft ionization measurements is applied to the identification of trace impurities in a fine chemical (triphenylphosphine).

Key Objectives:
  • Learn about how to use an automated data analysis software to identify trace impurities
  • How EI and soft ionization measurements successfully identify unknown trace impurities
  • Learn how to overcome problems arising from weak or absent molecular ions, which make it difficult to discriminate between compounds with different compositions, but similar mass spectra.

Brought to you by:
JEOL
Integrated Analysis of High Resolution GC-MS Data Using Hard and Soft Ionization to Identify Trace Impurities
Please complete the form to download the whitepaper.
By submitting this form, you agree to receive more information on related products and services from the American Chemical Society (ACS Publications) via email, in accordance with the ACS Privacy Policy .

Copyright © 2024 American Chemical Society | 1155 Sixteenth Street NW | Washington, DC 20036 | View our Privacy Policy